Analog Devices has launched a new three-axis, MEMS accelerometers that perform high resolution vibration measurement with very low noise to enable the early detection of structural defects via wireless sensor networks. The low power consumption of the new ADXL354 and ADXL355 accelerometers lengthens battery life and allows extended product usage by reducing the time between battery changes.

The low noise performance of the ADXL354 and ADXL355 with low power consumption makes it now possible to cost-effectively enable low-level vibration measurement applications such as Structural Health Monitoring (SHM). Additionally, the tilt stability of ADXL354 and ADXL355 accelerometers delivers excellent repeatability over temperature and time, which is ideal for orientation and navigation systems in unmanned aerial vehicles using Inertial Measurement Units (IMUs) and inclinometers. By providing repeatable tilt measurement under all conditions, the new accelerometers enable minimal tilt error without extensive calibration in harsh environments.

The ADXL354 and ADXL355 accelerometers offer guaranteed temperature stability with null offset coefficients of 0.15mg/C (max). The stability minimizes resource and expense associated with calibration and testing effort, helping to achieve higher throughput for device OEMs. In addition, the hermetic package helps ensure that the end product conforms to its repeatability and stability specifications long after they leave the factory.

Functional Block Diagram ADXL354

Functional Block Diagram ADXL355

With output of ±2g to ±8g full scale range (FSR), selectable digital filtering from 1 Hz to 1 kHz, and low noise density of 25µ/√ Hz at less than 200µA current consumption, the ADXL355 accelerometer offers performance levels comparable to much more expensive devices with less power consumption and BOM cost.

The ADXL35x series are suited to a wide range of applications including Inertial measurement units (IMUs), altitude and heading reference systems (AHRS), Platform stabilization systems, Structural health monitoring, Seismic imaging, Tilt sensing, Robotics and Condition Monitoring.

Features and Benefits

• Hermetic package offers excellent long-term stability
• 0 g offset vs. temperature (all axes): 0.15 mg/°C maximum Ultralow noise density (all axes): 20 µg/√ Hz (ADXL354)
• Low power, VSUPPLY (LDO enabled)
  • ADXL354 in measurement mode: 150 µA
  • ADXL355 in measurement mode: 200 µA
  • ADXL354/ADXL355 in standby mode: 21 µA
• ADXL354 has user adjustable analog output bandwidth
• ADXL355 digital output features
  • Digital serial peripheral interface (SPI)/I²C interfaces
  • 20-bit analog-to-digital converter (ADC)
  • Data interpolation routine for synchronous sampling
  • Programmable high- and low-pass digital filters
• Electromechanical self-test
• Integrated temperature sensor
• Voltage range options
  • VSUPPLY with internal regulators: 2.25 V to 3.6 V
  • V1P8ANA, V1P8DIG with internal low dropout regulator (LDO) bypassed: 1.8 V typical ± 10%
  • Operating temperature range: -40°C to +125°C
  • 14-terminal, 6 mm x 6 mm x 2.1 mm, LCC package

Click here for more information or to buy from Anglia Live.

Click here to download the datasheet.

The ADXL35x accelerometers are supported by the EVAL-ADXL35x-Z series of evaluation boards that allow quick evaluation of the performance of Analog Devices new series of low power, low noise, low drift 3-axis, MEMS accelerometers. The series  consists of both analog and digital output devices, supporting a variety of Full Scale Ranges (FSR). These evaluation boards are ideal for evaluation of the ADXL35x accelerometer series in an existing system because the stiffness and the small size of the evaluation board minimize the effect of the board on both the system and acceleration measurements. Click here to download the EVAL-ADXL35x-Z user guide.

Anglia are offering customers a FREE evaluation kit and samples of the ADXL35x three-axis, MEMS accelerometers from Analog Devices, please fill in the form below to register interest now.

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